ROUGHNESS AND STRUCTURE OF INGAASN THIN FILMS ON SI

Девицкий О.В. ROUGHNESS AND STRUCTURE OF INGAASN THIN FILMS ON SI // PHYSICAL AND CHEMICAL ASPECTS OF THE STUDY OF CLUSTERS NANOSTRUCTURES AND NANOMATERIALS. 2021. DOI: 10.26456/pcascnn/2021.13.106. Q

Сотрудник

Девицкий Олег Васильевич

Количество авторов

1

Год

2021

Девицкий О.В. ROUGHNESS AND STRUCTURE OF INGAASN THIN FILMS ON SI // PHYSICAL AND CHEMICAL ASPECTS OF THE STUDY OF CLUSTERS NANOSTRUCTURES AND NANOMATERIALS. 2021. DOI: 10.26456/pcascnn/2021.13.106. Q